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News & Events
STAr Technologies Launches Apollo WLBI Total Test Solution for Electro-Optical Device
Hsinchu, Taiwan - STAr Technologies, a leading supplier in the semiconductor test today, has launched STAr Apollo WLBI test solution for optical devices. This new system specifically developed and built to meet demanding wafer level burn-in test requirements for 5G Optical Devices by increasing throughput and decreasing test time through ultra-high parallel measurement capabilities, including traditional electrical measurements plus optical monitoring.

Apollo WLBI Total Solution
STAr Apollo WLBI is an advanced integrated total solution test system that includes a customized modular Apollo WLBI Per-pin SMU Test System, Magic A200e Probe Station, and vertical probecard. Apollo WLBI can be configured from the number of channels, voltage, current levels, and static or dynamic setup. With more than 6000 channels per pin SMU with various voltage and current ranges, the system allows sourcing and monitoring each channel to determine the pass-fail of the DUTs over time.

Apollo WLBI Per-pin SMUs Test System
Meanwhile, the probe station was designed with a thermal chuck that enabling high power and heat dissipation of 800W from the parallel devices burn-in cycle, thus allowing the devices to stay at working temperature conditions during the burn-in process. The probe station incorporated a high temperature and mechanical stability probe card adapter (>6000 pins) with a patented vacuum seal interface for constant electrical and optical contact with probecard. The high load chuck Z Stage allows probe force of greater than 400Kg across the chuck with less than 10um planarity change ensuring good probing contact during the burn-in cycle.

High Pin Count Probe Card Interface

800W High Dissipation Thermal Chuck
“The STAr Apollo WLBI is an advanced integrated test solution and supports industry customers to have a complete test experience in 5G Optical Devices. Users are also able to manage the whole process with Sagittarius series test platform and lower overall test expenditure for customers,” said Dr. Choon-Leong Lou, CEO of STAr Technologies.
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