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Vertical Probe Card
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Vertical Probe Card
Vertical Probe Card
STAr has developed a proprietary patented vertical probe card design that is tunable for wide varieties of parametric, mixed signal, memory IC and logic IC applications.
- WAT/E-test, reliability test applications and In-Process E-test
- Mixed-signal and analog ICs test
- Multi-DUT PMICs functional test
- Adopting advanced manufacturing process with cobra or pogo spring probes
- Efficiently diminish the signal attenuation
