Vertical Probe Card
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Vertical Probe Card
STAr has developed a proprietary patented vertical probe card design that is tunable for wide varieties of parametric, mixed signal, memory IC and logic IC applications.
  • WAT/E-test, reliability test applications and In-Process E-test
  • Mixed-signal and analog ICs test
  • Multi-DUT PMICs functional test
  • Adopting advanced manufacturing process with cobra or pogo spring probes
  • Efficiently diminish the signal attenuation
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  • Tel : +886-3-5717179
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