Reliability Test System
PRODUCTS > Reliability Test System
Reliability Test System
STAr uses its extensive industry expertise to design, build, test and support reliability systems for semiconductor devices and interconnects reliability life test, IC product burn-in, environmental test, product screening, PCB reliability test, etc. to fulfill all the needs to build a solid reliability engineering system.
  • All-in-one tester
  • For both engineering and production needs
  • Massively parallel reliability analysis
  • For both PLR and WLR applications
  • Back-end-of-line electromigration analysis
  • Supports JEDEC complaint methodologies
  • For high power devices with voltage requirements up to +200 V
  • DMOS and power MOSFETs test
  • Compound semiconductor reliability test
  • RF-biased and high-voltage accelerated life testing
  • Streamlined software for accurate measurement
  • Effective analysis for decision information management
  • 2F., No.101, Gongdao 5th Rd., Sec. 2, Hsinchu City 300046, Taiwan
  • Tel : +886-3-5717179