Reliability Test Solutions
SOLUTIONS > Reliability Test Solutions
Reliability Test Solutions
STAr provides complete and advanced semiconductor reliability test systems to industry customers, comprising of design for package-level and wafer-level reliability characterization qualification to meet defacto standards.
  • Spot and sweep measurement
  • Intuitive GUI for convenient device characterization
  • MOSFET HCI, NBTI and Fast-OTF reliability qualifications
  • Full configuration with max. SMU requirements
  • 2F., No.101, Gongdao 5th Rd., Sec. 2, Hsinchu City 300046, Taiwan
  • Tel : +886-3-5717179