Parametric (WAT) Probe Card
PRODUCTS > Parametric (WAT) Probe Card
Parametric (WAT) Probe Card
STAr's strong R&D with its high-quality manufacturing line enables the development of advanced parametric and reliability probe cards for low-leakage current tests, high temperature probing, and small pad contacts.
  • Low-level leakage/capacitance testing
  • Accurate and consistent results
  • Extreme operation temperature
  • Ensures accurate and consistent results
  • Good return paths for high speed/frequency signals
  • High frequency probes for RF measurement
  • For special applications and test environments
  • Parallel probing of hybrid integrated circuits
  • High temperature and low-leakage current WLR test solution
  • Enhance production efficiency and throughput
  • 2F., No.101, Gongdao 5th Rd., Sec. 2, Hsinchu City 300046, Taiwan
  • Tel : +886-3-5717179