^
PRODUCTS
MEMS Probe Card
PRODUCTS > MEMS Probe Card
MEMS Probe Card
STAr has designed and developed MEMS (Micro-Electro-Mechanical Systems) type probe card suitable for testing of highly parallel large-array multi-DUT devices to increase productivity with greatly reduce cost-of-test.
  • Large array multi-DUT tests
  • DRAM and FLASH memory ICs wafer tests
  • World first fine-pitch high current MEMS vertical probe card
  • 2F., No.101, Gongdao 5th Rd., Sec. 2, Hsinchu City 300046, Taiwan
  • Tel : +886-3-5717179
  • Copyright STAr Technologies Inc. 思達科技 All Rights Reserved. 
  • Privacy Policy