Functional Probe Card
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Functional Probe Card
STAr's functional test cantilever probe cards represent the finest technology on the market for wafer-sort, built-in self-tests (BIST), known good die (KGD), burn-in, image sensor etc.
  • Supports most ATE platforms
  • Multi-DUTs support
  • Supports 1/1.2/2/2.4/4 single/dual/quad/Over 8 Multi-Die layout
  • Supports most industry ATE platforms
  • Highly parallel probing capability
  • CIS probes for CMOS/CCD image sensors
  • High-speed (1.5 Mbps) LVDS/MIPI signals
  • Stable long lifetime multi-DUT LED test probe cards
  • Wide varying probe layout configurations for accurate probing
  • 2F., No.101, Gongdao 5th Rd., Sec. 2, Hsinchu City 300046, Taiwan
  • Tel : +886-3-5717179