STAr Completes Order for Pluto-hiVIP All-in-One Dynamic High Current & Voltage Reliability Test System.
STAr Unveils Aries-Prima One-Touch Memory Test Probe Card.
STAr Technologies completed development of Aries Optima MEMS probe cards.
STAr-LAIT BSI probe-and-test system is developed for high-throughput micro-LED backside imaging LIV tests.
STAr Technologies has completed qualification of Aries-Optima SP45 for pre-bumped wafer tests with one of the world leading foundries.
STAr Technologies completed its development of one-touch tri-temperature flash memory probe card for wafer-sort and KGD.
STAr Technologies expanded its test system and probe card manufacturing facilities in Hsinchu Taiwan to cater for new market demands.