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ABOUT STAr
Milestone
2022

3

STAr Completes Order for Pluto-hiVIP All-in-One Dynamic High Current & Voltage Reliability Test System.

5

STAr Unveils Aries-Prima One-Touch Memory Test Probe Card.

2021

1

STAr Technologies completed development of Aries Optima MEMS probe cards.

6

STAr-LAIT BSI probe-and-test system is developed for high-throughput micro-LED backside imaging LIV tests.

9

STAr Technologies has completed qualification of Aries-Optima SP45 for pre-bumped wafer tests with one of the world leading foundries.

12

STAr Technologies completed its development of one-touch tri-temperature flash memory probe card for wafer-sort and KGD.

12

STAr Technologies expanded its test system and probe card manufacturing facilities in Hsinchu Taiwan to cater for new market demands.

  • 2F., No.101, Gongdao 5th Rd., Sec. 2, Hsinchu City 300046, Taiwan
  • Tel : +886-3-5717179