Virgo-hiVIP is probe card for use with high voltage, current and power devices such as IGBT, DMOS, BJT, etc.  Virgo-hiVIP with "Smart-Clamp" technology is constructed with passive and active devices befitted for testing power devices of up to 10KV and/or 20A.  This technology prevents probe burnt or melt when excessive voltage or current flows through the devices.

Virgo-ST is a special thermal probe card used for ensuring that the parametric tester and probe card are under controlled environment when the wafer is under high or low temperature probing.  This thermally stable environment ensures that the parametric tester is within the specification temperature and test accuracies are gauranteed.

Virgo-HF is used for probing wired and wireless devices up to a frequency of 7 GHz at a minimum pitch of 100 um.  Virgo-HF employs high frequency coaxial probes with SMA connectors for high speed/frequency signal transfer.  STAr will design accompanying DC probes for ground connections so as to ensure good shielding and return paths for high speed/frequency signals.

Virgo-RF is used for probing radio frequency devices up to a frequency of 18 GHz.  Virgo-RF uses high frequency GSG, GS or SG probes with 2.4 mm RF connectors for high frequency signal transfer.  STAr can further deploy low-leakage DC probes for one-pass DC-RF tests especially for used with Agilent 4080 series advanced parametric testers.

STAr partners with our customers to develop specialized probe cards for any applications and test environments.  With STAr's many patented technologies and strengths in ceramic PCB, small pad probing, high isolation and frequency, etc. put STAr in the forefront of parametric test probe cards with many successful ventures with customers.

Cancer-HIC probe card is used extensively in the laser trimming of MLC chip resistors. Cancer-HIC has extremely low contact resistance and available with Kelvin (4-wire) type probing enabling very accurate resistance measurements. Cancer-HIC is also used for parallel probing of hybrid integrated circuits such as power transistors, diodes, etc.