Virgo-PRO II-HT/UT is production-level probe cards for used with Agilent 4070 series parametric testers in reliability tests capable for wafers tests of up to 150 degC (HT) and 200 degC (UT) for prolong period of up to 600 hrs.  Virgo-PRO II-HT/UT ensures stable low leakage current of down to 1.0 pA under varying temperatures, thus ensuring that the test data are actual device performance.

Virgo-PRO II-ET is production-level probe cards for used with Agilent 4070 series parametric testers in reliability tests capable for wafers tests of up to 300 degC.  STAr's "forced-air cooling" patented technology maintains the electrical and mechanical characteristics of probe cards under high temperature, thus ensuring accurate relability test results are obtained with leakage current down to 1.0 pA.

Virgo-SEMI-UT is engineering-level probe cards for used with parametric test instruments and engineering probers in wafer-level reliability tests of up to 200 degC (UT) for prolong period of up to 600 hrs.  Virgo-SEMI-UT ensures stable low leakage current of down to 100 fA under varying temperatures, thus ensuring that the test data are actual device performance.

Virgo-SEMI-ET is engineering-level probe cards used with parametric instruments and engineering probers in wafer-level reliability tests of up to 300 degC.  STAr's "forced-air cooling" patented technology maintains the electrical and mechanical characteristics of probe cards under high temperature, thus ensuring accurate relability test results are obtained with leakage current down to 100 fA.