High performance probe card with ultra-low leakage current and parasitic capacitance for engineering probe station with 115 mm width probe card holder.  Virgo-SEMI also enables stable probing at wide temperature range (-40 degC ~ +300 degC) at small pads down to 30 um.sq which makes it highly suitable for device characterization, reliability qualification, SPICE modeling tests, etc.

Virgo-PRO II is production-level probe cards for used with Agilent 4070 series parametric testers in electrical and wafer acceptance tests.  The probe card is constructed of high rigidity multi-layered ceramic PCB and thus enabling consistent probing of small pads (down to 30 um.sq) at high temperature (up to 200 degC)  for testing low-level current below 1.0 pA accurately.

Virgo-PRO K is an advanced production-level probe cards for used with Agilent 4070 series parametric testers for wafer acceptance tests of nanometer fabrication processes.  The Kelvin design enables extremely accurate measurements of low-voltage high-current advanced semiconductor nanometer devices and very low resistance copper interconnects.

Virgo-PRO Z is production-level vertical probe cards for used with Agilent 4070 series parametric testers in advanced electrical and wafer acceptance tests.  Virgo-PRO Z is the leading parametric probe cards for testing advanced nanometer semiconductor devices with pads below 30 um square and less than 100 fA leakage current at temperature up to 200 degC.

Virgo-PRO 62 is production-level probe cards for used with HP 4062 series parametric testers in electrical and wafer acceptance tests.  The cost effective probe cards extents the useful life of legacy HP 4062 testers for probing advanced semiconductor devices enabling low leakage current measurements and small pads probing.