STAr's Capricorn-MS 4-axes positioner 16-site probe station uses Virgo-MULTI probe card for high temperature low-leakage current advanced wafer-level reliability tests. These cost effective probe cards can easily be attached to the multi-site Capricorn-MS positioner with temperature of up to 300 degC and pad size down to 35 um.sq.

Virgo-MP is the probe card used with STAr's Capricorn-MP 6-axes multi-site positioner.  The Capricorn-MP with Virgo-MP can be placed directly onto Cascade or Suss engineering probe station without the need for expensive probe card holders. Virgo-MP is highly suitable for flexible multi-site probing used in wafer-level reliability tests.