STAr Sagittarius WLR comprises of the industry de-facto standard parametric integrated software with full suite of wafer-level reliability (WLR) test algorithms for electromigration (EM), hot-carrier injection (HCI), biased temperature instability (BTI), time-dependent dielectric breakdown (TDDB), etc.  Special applications for multi-die WLR for enhanced throughput are also available.

STAr Aquarius RDA provides dynamic data analysis and graphical interpretation of reliability results for immediate analysis and reporting. The closely linked data enables deep-level "drill-in" of information to identify the root cause of weak devices and enables user to isolate and eliminate weak parts.  Aquarius RDA is available for HCI/BTI, GOI/TDDB, Vt Stability and EM applications.