STAr Scorpio hiVIP series covers the reliability requirements for high power devices with voltage requirements up to ±200V.  Systems are designed to support precise low and high voltage stress bias at board level to fulfill the test needs of DMOS, IGBT and power MOSFETs.  Power devices reliability applications include safe operations area (SOA) analysis of HCE, HTRB and HTGB.

Scorpio hiVIP – GOI/TDDB system provides GOI/TDDB reliability test capabilities for high power MOSFET and capacitors. System is available for package level reliability tests. Advanced direct-docking of DUT boards ensures accurate data and further enables multiple experiment to be performed in one system at any one time.

Scorpio hiVIP – Vt Stability Reliability Tester is designed for Vt Stability analysis with different stress & temperature profiles in conformance to the industrial needs for high power devices.  System is available for package level reliability tests of 144 DUTs.  Advanced direct-docking ensures accurate data and further enables multiple experiment to be performed in one system at any one time.