STAr Scorpio HCI/BTI Reliability Tester is equipped with JEDEC compliant test requirements for advance and accurate MOSFET HCI, NBTI and OTF reliability qualifications.  Full configuration supports package level tests for up to 288 DUTs in parallel.  Advanced direct-docking ensures accurate data and further enables multiple experiment to be performed in one system at any one time.

STAr Scorpio HCI/BTI Reliability Tester is equipped with JEDEC compliant test requirements for advance and accurate MOSFET HCI, NBTI and Fast-OTF reliability qualifications.  The full configuration with maximum SMU requirements provides concurrent measurements for highly precise short monitoring intervals, for advanced requirements for WLR test methodology for nanotechnology device reliability qualifications.

STAr Scorpio GOI/TDDB Reliability Tester provides JEDEC compliant test needs for advance oxide reliability analysis.  VTDDB, VSILC and D/G Stress analysis for both MOSFET and capacitors are available.  Full configuration supports package level tests for up to 288 DUTs in parallel. Advanced direct-docking ensures accurate data and further enables multiple experiment to be performed in one system at any one time.

STAr Scorpio GOI/TDDB Reliability Tester provides JEDEC compliant test needs for advance oxide reliability analysis.  VTDDB, VSILC and D/G Stress analysis for both MOSFET and capacitors are available.  The additional Fast-VTDDB and multi-voltage level VSILC functions allow continuous stress bias with short interval monitoring for high resolution time-to-breakdown for WLR applications.