STAr's Virgo-Zenith parametric and reliability tests vertical probe cards enable small pad probing (<30 um.sq) for advanced nanometer processes with high performance specifications.  These probe cards are highly suitable for ultra-low leakage current tests (<100 fA) at extreme thermal environment (-40 degC ~ +200 degC) while having contact resistance of <0.3 ohm.

STAr partners with BucklingBeam Solutions to deliver cost-effective high-density vertical probe card technology for functional tests of SOC and BGA ICs.  Our optimized vertical probe contact solutions provide unprecedented cost-performance to lower cost-of-tests for high performance ICs.  BucklingBeam's latest offerings include direct-docking probe cards for Verigy's 93000 and Advantest's T2000 ATEs.

STAr's Aries-Zenith MIP is a new vertical probe card technology for testing memory ICs.  Aries-Zenith MIP enables high parallelism memory IC tests at pitch down to 70 um and also wafer-level burn-in tests from -40 degC to 200 degC. Aries-Zenith MIP does not require space transformer thus enabling larger probing area, lower cost and shorter lead time in comparison with other types of vertical probe cards.

STAr's Aries-Zenith LPC is specifically targeted at delivering best-of-test for low pin count mixed-signal ICs.  Aries-Zenith LPC enables small pad probing down-to 30 um.sq with consistent contact resistance of < 0.5 ohm.  Aries-Zenith LPC enables accurate high-current low-voltage Kelvin-type probing of bumped pads for multi-DUT PMICs (power management ICs) functional tests.