STAr is the technological leader in parametric probe cards providing the best to both engineering and production used with wide patent coverage.  STAr's Virgo series of high performance parametric probe cards enable low-level leakage current and capacitance testing with consistent results and high accuracies under extreme thermal conditions on small pads used in nanometer technologies.

STAr's technologically advanced probe cards for reliability qualification have enabled users to probe and test devices under extreme operating environment from -65 degC to +300 degC for prolonged period of time (>600 hrs).  STAr's Virgo series reliability probe cards are the best for wafer-level reliability tests ensuring consistent and accurate results for advanced nanometer processes.

STAr has developed high temperature and low-leakage current multi-die/site probing solution to fulfill demanding needs of multi-die parametric and reliability tests.  STAr's flexible and fixed type multi-die probe cards are highly suitable for reliability qualificaiton of advanced ultra low-K interconnects and high-K metal gate transistors within short period of time.

STAr's engineering team has worked with many customers to design and develop specialized probe cards to meet extreme needs.  STAr's specialized probe cards include needs for high voltage/current/power, high/radio frequency, thermal management, optical probing, etc.  STAr continues to invest for new technoligies and aspire to make better probe cards to meet your needs.