STAr's Aries-SIPs (SOC IC Probe Cards) are produced for use with digital, mixed-signal, analog, CIS and power ICs supporting most ATE platforms from Verigy, Teradyne, LTX/Credence, Advantest, etc. Aries-SIP enables technologies that support probing of small pads, bumped pads, ball grid array (BGA), circuits under pads (CUP), etc.

STAr's Aries-LIPs (LCD Driver IC Probe Cards) are design and build to supporting ATE platforms from Advantest, Yokogawa, Teradyne, etc. Aries-LIP enables ultra-small pitch (<20 um) and high frequency (>300 MHz) probing that is crtical for testing state-of-the-art LCD driver ICs. Aries-LIP is used in most technologies such as Al pad / Au bump / TAB / COF at chip probe (CP) or final tests (FT).

STAr's Aries-MIPs (Memory IC Probe Cards) are design and build to sustain highly parallel probing of DRAMs, SRAM, FLASH, etc. memory chip sort and burn-in tests. Aries-MIP probe cards in excess of 3000 pins configured with 128 DUTs in parallel have been qualified and tested with ATE platforms from Advantest, Verigy, Credence, etc. Advanced WLCSP and 3D-stacked dies are also supported.