STAr Scorpio ART provides the series of reliability testers to support massively parallel advanced semiconductor reliability analysis.  All systems are designed to fulfill JEDEC requirements to support advance and accurate MOSFET HCI/BTI, GOI/TDDB and OTF qualifications for nanotechnology devices. Systems for both PLR and WLR applications are available. 

STAr Scorpio hiVIP series covers the reliability requirements for high power devices with voltage requirements up to ±200V.  Systems are designed to support both precise lo- and hi- voltage stress bias at board level to fulfill the tests requirements on both DMOS and power MOSFETs.  Power devices reliability applications including HCE/HTRB/HTGB, GOI/TDDB and Vt Stability are available. 

Timely and accurate analysis of the reliability data for prompt feedback to the process line has become a critical criterion in the semiconductor industry.  Handling massive data for statistical analysis has been the bottleneck for reliability engineers.  STAr provides the software solution for the reliability data analysis, for immediate degradation and lifetime analysis and reporting.