STAr revolutionizes the semiconductor industry with new knowledge-based intellectual properties, products and solutions through "Verticalization" and "Horizontalization". By "Verticalization", STAr provides integrated turnkey solution for customers with a unified test platform to integrate test hardware, software, interfaces and applications. By "Horizontalization", STAr provides enterprise solutions for up-stream links to design and down-stream test data for information analysis and management decision making.
STAr provides full ranges of parametric test instruments, matrices and software to cater for all customers' needs and applications. STAr also caters for high-density parametric systems for 3D IC package tests, high-potential PCB tests, etc.
STAr provides reliability test systems for semiconductor wafer fabs front-end device and back-end interconnect reliability qualification. STAr further partners with customers to develop specialized reliability testers for LED, OLED, MEMS, etc.
STAr provides test intellectual properties, software and integration expertise to meet the present and future test challenges for power management ICs, CMOS image sensors, wired/wireless communications ICs, etc functional tests.
STAr provides leading test management and visual analytics software for wafer acceptance test, process control monitoring, reliability analysis, yield enhancements and defect management to shorten product time-to-market.
STAr provides excellent vision tools and software for precise substrate metrology, control of wafer geometry and surface topography which are of importance to nanometric dimension structures and atomic layer thin films.
STAr is the leading supplier of high quality low-leakage current, ultra-high voltage, wide temperature range and multi-site/die probe cards for electrical tests, wafer-acceptance tests and reliability qualification.
STAr's functional cantilever probe cards represent the finest epoxy technology on the market that features extreme fine pitch (<20 um) for LCD driver ICs and high density probe counts (>3000) for multi-DUT logic and memory ICs.
STAr has developed a proprietary patented vertical probe card technology featuring high carrying current, superior lifetime and scalability to address the industry's most demanding pitch requirements.
STAr partners closely with leading probe station suppliers to provide standard and/or customized high-value top-end probe stations for multi-die probing and probe card positioners.
STAr provides "one-stop shop" complete solution services to its customers covering parametric and reliability tests, probe cards, assembly and packaging from research, development to qualification.
