2015-09-30
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Revolutionary Dynamic AC Test System for Power Transistors  
 

Hsinchu, Taiwan, September 30th, 2015 STAr Technologies is one of the leading test systems and probe cards supplier for the semiconductor industry since its establishment in 2000, announces the launch of a new family of systems called the Taurus-PDAT (Power Device Analytical Tester). 

Inductive Switching Family of Timing Curves

Energy conversion and storage has become a critical sub-system for automotive industry, green technologies and clean energy management.  One of the key components for such applications is power MOSFETs (Metal-Oxide-Semiconductor Field Effect Transistors) and IGBTs (Insulated Gate Bipolar Transistors).  In order to improve the efficiency, reliability and yield of such devices, manufacturers have to correctly characterize the dynamic electrical performance.  The dynamic test data has not been able to meet requirements from system manufacturer as the parasitic effects of the test system have dominated the actual device dynamic performance data.

The revolutionary test technologies in Taurus-PDAT has overcome such difficulties and enables manufacturers of Power MOSFETs and IGBTs to test dynamic AC tests in both characterization and high volume production. This is a technically-challenging combination, but one that enhances correlation confidence between the engineering lab and the back-end test floor. 

The Taurus-PDAT family’s first offering includes AC dynamic test modes such as Switching, Reverse Bias Safe Operating Area, Diode Recovery, Gate Charge, Unclamped Inductive Load, and Short Circuit, performed at high energies such as 1500V/1000A short circuit and ultra-high bandwidth of greater than 10,000A/us inductive switching tests. Insert figure shows a family of inductive switching current curves, with varying gate voltages, with a fastest slew rate of 2000 A per µS.

With selectable capacitor banks, the varying energy requirements of low, medium, and high voltage devices can be met, but it is PDAT’s innovative stimulus and measurement designs that make it unique. Competitive solutions are difficult to move into production because of the limited space available close-in on device handlers. STAr enables this capability with low parasitic DUT board design with miniaturized components and integrated current sensors.

Industry-leading slew rates are also enabled by the Taurus-PDAT integrated current sensors design, up to 10,000 Amps per µS, enables STAr to provide this capability without the considerations for long cablings between testers and IC handlers or probers.  For protecting the system and handler sockets in case of catastrophic device failure, stored energy is managed automatically, and ultra-high-speed custom semiconductor circuit breakers are employed.

Due to the complexity of dynamic power transistor tests, STAr works closely with our users to provide customized sockets, thermal chamber, and probing solutions to ensure that all technical requirements can be met with highest system level performance.  The production software and debug environment (Helios) draws on over 15 years of the design team’s experience, optimized for fast test time, with specialized environments for program development, debug, production operation, handler control, and data analysis.   This open architecture software further enables engineers to optimize test algorithms and automate test flows as required for either characterization or production needs. 

“In response to market demands, power electronics systems have driven innovation in the basic technologies of circuit technologies, control systems and power semiconductors,” stated Dr. Choon-Leong Lou, CEO of STAr Technologies, “STAr Taurus-PDAT’s revolutionary dynamic AC tests capabilities enables corresponding power devices to be developed, characterized and manufactured in a timely manner, with great confidence and lower costs.”

About STAr Technologies

STAr Technologies specializes in advanced test systems, software, probe cards and professional services for the semiconductor industry. STAr’s expertise extents across parametric electrical tests (E-test), wafer-level and package-level reliability tests (WLR & PLR), analog/mixed signal automatic test equipment (ATE), probe cards, test load boards and IC test sockets. STAr Technologies is established in August 2000 with headquarter based in Hsinchu, Taiwan and subsidiaries in U.S.A., Japan, South Korea, Singapore, China and India.


For further information, please contact:
MarCom Specialist
Tel: +886-3-571-7179 ext. 320
Fax: +886-3-571-7517
Email: marketing@star-quest.com

 

 

 

 

 

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