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Functional Probe Card
STAr's functional cantilever probe cards represent the finest epoxy technology on the market that features extreme fine pitch (<20 um) for LCD driver ICs and high density probe counts (>3000) for multi-DUT logic and memory ICs....
2017-10-31
48th International Test Conference (ITC)
2017-09-06
International Electron Devices & Materials Symposium 2017
2017-09-06
aps Solutions GmbH enters into a Distributor and Service agreement with STAr Technologies for advanced and high-end Probe Cards
2017-06-28
STAr Technologies Opens New Headquarter to Better Service Customers
2017-06-04
27th Annual SW Test Workshop (SWTW)
2017-05-28
29th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
2017-05-26
VOICE 2017 - Advantest Developer Conference
2017-04-02
2017 IEEE International Reliability Physics Symposium (IRPS)
2017-04-01
STAr Technologies Announces Expansion of India Subsidiary
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