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Metrology Tool
STAr provides excellent vision tools and software for precise substrate metrology, control of wafer geometry and surface topography which are of importance to nanometric dimension structures and atomic layer thin films....
2021-03-21
2021 IEEE International Reliability Physics Symposium (IRPS)
2021-03-17
2021 SEMICON China
2020-12-01
2020 TSES
2020-11-17
STAr Technologies Launches Apollo WLBI Total Test Solution for Electro-Optical Device
2020-11-11
SWTest Untethered 2020
2020-11-07
STAr Technologies Awarded as Excellent Manufacturer at Industrial Festival
2020-11-03
2020 International Test Conference (ITC)
2020-10-13
2020 Electronic Design Innovation Conference(EDI CON)
2020-10-07
STAr Sagittarius Intelligent Parametric Test System Awarded “the National Brand YuShan Award as a “Best Product”
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