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Metrology Tool
STAr provides excellent vision tools and software for precise substrate metrology, control of wafer geometry and surface topography which are of importance to nanometric dimension structures and atomic layer thin films....
2017-10-31
48th International Test Conference (ITC)
2017-09-06
International Electron Devices & Materials Symposium 2017
2017-06-28
STAr Technologies Unveils New Headquarter to Better Service Customers
2017-06-04
27th Annual SW Test Workshop (SWTW)
2017-05-28
29th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
2017-05-26
VOICE 2017 - Advantest Developer Conference
2017-04-02
2017 IEEE International Reliability Physics Symposium (IRPS)
2017-04-01
STAr Technologies Announces Expansion of India Subsidiary
2017-03-14
SEMICON China 2017
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