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Metrology Tool
STAr provides excellent vision tools and software for precise substrate metrology, control of wafer geometry and surface topography which are of importance to nanometric dimension structures and atomic layer thin films....
2020-05-13
STAr Technologies Expands Probe Cards and Test Systems Manufacturing Facilities
2020-03-16
STAr Announces Shipments of Anisotropic Conductive Elastomer
2020-03-10
STAr’s Subsidiary Accel-RF Announces Shipment of 5G Ka-Band AARTS Reliability System
2020-02-26
STAr Acquires Accel-RF to Expand Scope of Strategic Fit in Reliability Test Offerings
2020-01-09
STAr Technologies Unveils World First Thermal Wafer-Level Flip-Chip Laser-Diode/Photo-Diode Probe and Test System
2019-11-12
2019 International Test Conference (ITC)
2019-11-12
STAr Virgo Series Probe Card Awarded “the National Brand YuShan Award” as a Best Product
2019-10-31
STAr Technologies (Wuhan) Celebrates the Grand Opening of its New Office in Future City
2019-10-30
STAr Technologies Introduces MEMS Micro-Cantilever Probe Cards for CMOS Sensor Test
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