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STAr provides "one-stop shop" complete solution services to its customers covering parametric and reliability tests, probe cards, assembly and packaging from research, development to qualification....
2020-03-29
2020 International Reliability Physics Symposium (IRPS)
2020-03-15
2020 Applied Power Electronics Conference and Exposition (APEC)
2019-11-12
2019 International Test Conference (ITC)
2019-11-12
STAr Virgo Series Probe Card Awarded “the National Brand YuShan Award” as a Best Product
2019-10-31
STAr Technologies (Wuhan) Celebrates the Grand Opening of its New Office in Future City
2019-10-30
STAr Technologies Introduces MEMS Micro-Cantilever Probe Cards for CMOS Sensor Test
2019-10-29
5th Annual TestConX China Workshop
2019-10-17
2nd Annual SW Test Asia - 2019 (SWTEST ASIA)
2019-10-16
STAr Technologies Introduces Advanced Integrated Test System for Micro-LED
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