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Metrology Tool
STAr provides excellent vision tools and software for precise substrate metrology, control of wafer geometry and surface topography which are of importance to nanometric dimension structures and atomic layer thin films....
2018-10-18
1st Annual SW Test Asia - 2018 (SWTEST ASIA)
2018-06-14
STAr Technologies Acquires ProbeLogic and Obtains ACE Technology
2018-06-03
28th Annual SW Test Workshop (SWTW)
2018-05-23
VOICE 2018
2018-03-14
2018 SEMICON China
2018-03-11
2018 IEEE International Reliability Physics Symposium (IRPS)
2018-03-04
2018 Applied Power Electronics Conference and Exposition (APEC)
2017-10-31
48th International Test Conference (ITC)
2017-10-08
Reedholm Signs Joint Agreement With STAr Technologies
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