Parametric Probe Card
Functional Probe Card
Vertical Probe Card
NEWS & EVENTS
STAr provides "one-stop shop" complete solution services to its customers covering parametric and reliability tests, probe cards, assembly and packaging from research, development to qualification....
27th Annual SW Test Workshop (SWTW)
29th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
2017 IEEE International Reliability Physics Symposium (IRPS)
SEMICON China 2017
STAr Technologies Acquired Best-Tech Optronics to Extent Vertical Probe Card Business
2016 International Test Conference (ITC)
STAr Technologies Showcases Advanced High Power MOSFET and IGBT Dynamic AC Tester at ITC 2016
The 11th International Conference & Exhibition on Microwave and Antenna (2016 IME/China)
New Generation HTOL, HAST and PTCT Burn-In Testers for Semiconductor Power Devices
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