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Parametric Probe Card
STAr is the leading supplier of high quality low-leakage current, ultra-high voltage, wide temperature range and multi-site/die probe cards for electrical tests, wafer-acceptance tests and reliability qualification....
2019-10-17
2nd Annual SW Test Asia - 2019 (SWTEST ASIA)
2019-06-02
29th Annual SW Test Workshop (SWTW)
2019-04-01
2019 Electronic Design Innovation Conference(EDI CON)
2019-03-31
2019 IEEE International Reliability Physics Symposium (IRPS)
2019-03-20
2019 SEMICON China
2019-03-18
Low-Cost, High-Performance and Reliable Ceramic Blade Probes from STAr Technologies
2019-03-17
2019 Applied Power Electronics Conference and Exposition (APEC)
2019-03-05
STAr Technologies unveiled Taurus TS-8500 Switch Matrix Mainframes
2018-10-18
1st Annual SW Test Asia - 2018 (SWTEST ASIA)
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