ABOUT STAr
Company
Company01
Company02
Company03
PRODUCTS
Parametric Test
Reliability Test
Functional Test
Yield Enhancement
Metrology Tool
Parametric Probe Card
Functional Probe Card
Vertical Probe Card
Probe System
Professional Service
NEWS & EVENTS
Latest News
Events
Archives
PARTNERS
Solution Partners
Business Associates
Industry Partners
CONTACT US
STAr Group
Representatives
Metrology Tool
STAr provides excellent vision tools and software for precise substrate metrology, control of wafer geometry and surface topography which are of importance to nanometric dimension structures and atomic layer thin films....
2021-03-21
2021 IEEE International Reliability Physics Symposium (IRPS)
2021-03-17
2021 SEMICON China
2020-12-01
2020 TSES
2020-11-17
STAr Technologies Launches Apollo WLBI Total Test Solution for Electro-Optical Device
2020-11-11
SWTest Untethered 2020
2020-11-07
STAr Technologies Awarded as Excellent Manufacturer at Industrial Festival
2020-11-03
2020 International Test Conference (ITC)
2020-10-13
2020 Electronic Design Innovation Conference(EDI CON)
2020-10-07
STAr Sagittarius Intelligent Parametric Test System Awarded “the National Brand YuShan Award as a “Best Product”
★ ★ ★ ★ ★
Home
l
Site Map
l
Contact Us
l
Privacy Policy
l
Terms of Use
Copyright STAr Technologies Inc. All Rights Reserved.