ABOUT STAr
Company
Company01
Company02
Company03
PRODUCTS
Parametric Test
Reliability Test
Functional Test
Yield Enhancement
Metrology Tool
Parametric Probe Card
Functional Probe Card
Vertical Probe Card
Probe System
Professional Service
NEWS & EVENTS
Latest News
Events
Archives
PARTNERS
Solution Partners
Business Associates
Industry Partners
CONTACT US
STAr Group
Representatives
Vertical Probe Card
STAr has developed a proprietary patented vertical probe card technology featuring high carrying current, superior lifetime and scalability to address the industry's most demanding pitch requirements....
2018-10-18
1st Annual SW Test Asia - 2018 (SWTEST ASIA)
2018-06-14
STAr Technologies Acquires ProbeLogic and Obtains ACE Technology
2018-06-03
28th Annual SW Test Workshop (SWTW)
2018-05-23
VOICE 2018
2018-03-14
2018 SEMICON China
2018-03-11
2018 IEEE International Reliability Physics Symposium (IRPS)
2018-03-04
2018 Applied Power Electronics Conference and Exposition (APEC)
2018-01-31
STAr Ships Multiple Leading Edge Automatic Silicon Photonics Test Systems
2017-10-31
48th International Test Conference (ITC)
★ ★ ★ ★ ★
Home
l
Site Map
l
Contact Us
l
Privacy Policy
l
Terms of Use
Copyright STAr Technologies Inc. All Rights Reserved.
