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Vertical Probe Card
STAr has developed a proprietary patented vertical probe card technology featuring high carrying current, superior lifetime and scalability to address the industry's most demanding pitch requirements....
2020-06-07
30th Annual SW Test Workshop (SWTW)
2020-05-10
TestConX USA 2020
2020-03-29
2020 International Reliability Physics Symposium (IRPS)
2020-03-15
2020 Applied Power Electronics Conference and Exposition (APEC)
2020-02-26
STAr Acquires Accel-RF to Expand Scope of Strategic Fit in Reliability Test Offerings
2020-01-09
STAr Technologies Unveils World First Thermal Wafer-Level Flip-Chip Laser-Diode/Photo-Diode Probe and Test System
2019-11-12
2019 International Test Conference (ITC)
2019-11-12
STAr Virgo Series Probe Card Awarded “the National Brand YuShan Award” as a Best Product
2019-10-31
STAr Technologies (Wuhan) Celebrates the Grand Opening of its New Office in Future City
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