Parametric Probe Card
Functional Probe Card
Vertical Probe Card
NEWS & EVENTS
STAr provides full ranges of parametric test instruments, matrices and software to cater for all customers' needs and applications. STAr also caters for high-density parametric systems for 3D IC package tests, high-potential PCB tests, etc....
2017 IEEE International Reliability Physics Symposium (IRPS)
SEMICON China 2017
STAr Technologies Acquired Best-Tech Optronics to Extent Vertical Probe Card Business
2016 International Test Conference (ITC)
STAr Technologies Showcases Advanced High Power MOSFET and IGBT Dynamic AC Tester at ITC 2016
The 11th International Conference & Exhibition on Microwave and Antenna (2016 IME/China)
New Generation HTOL, HAST and PTCT Burn-In Testers for Semiconductor Power Devices
FormFactor Unconditionally Withdrew Its Patent Infringement Lawsuit Against STAr Technologies
28th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
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