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Parametric Probe Card
STAr is the leading supplier of high quality low-leakage current, ultra-high voltage, wide temperature range and multi-site/die probe cards for electrical tests, wafer-acceptance tests and reliability qualification....
2012-05-08
Rudolph Probe Forum 2012
2012-05-03
STAr Technologies Successfully Promotes Advanced Device Reliability Test Solutions at 2012 IEEE IRPS
2012-04-26
2012 Symposium on Nano Device Technology (SNDT) 第19屆奈米元件技術研討會
2012-04-15
2012 IEEE International Reliability Physics Symposium (IRPS)
2012-04-10
2012 Semiconductor and Component Test & Measurement Seminar (2012半導體與元件測試技術論壇)
2012-03-17
STAr Technologies Announces Expansion of Subsidiary in China
2011-12-09
STAr Technologies Successfully Promotes Key Products at SEMICON JAPAN 2011
2011-12-07
SEMICON Japan 2011 (Exhibition Hall 8, Booth 8A-304)
2011-12-01
STAr Technologies Awarded First Order of Multiple Scorpio Advanced Reliability Test Systems in Japan
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