2013-06-09

2013 IEEE Semiconductor Wafer Test Workshop (SWTW)

2013-04-15

STAr Technologies Introduces Advanced Electromigration System at 2013 IRPS

2013-04-14

2013 IEEE International Reliability Physics Symposium (IRPS)

2013-03-27

2013 Semiconductor and Component Test & Measurement Seminar (2013半導體與元件測試技術論壇)

2013-03-19

SEMICON China 2013

2013-03-03

2013 Burn-in & Test Strategies Workshop (BiTS)

2012-12-05

SEMICON Japan 2012 (Exhibition Hall 8, Booth 8C-816)

2012-12-03

STAr Technologies Showcases Advanced Probe Cards in SEMICON Japan

2012-11-30

STAr Technologies Introduces Advanced DC-Pulsed and AC-Dynamic Test Systems for High Power Devices

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