Metrology Tool
STAr provides excellent vision tools and software for precise substrate metrology, control of wafer geometry and surface topography which are of importance to nanometric dimension structures and atomic layer thin films....
2010-09-08
SEMICON Taiwan 2010 (TWTC, Hall 1, Booth 2904)...
2010-09-01
STAr Technologies Unveils Industry's First Semiconductor Par...
2010-08-29
STAr Technologies Celebrates its 10th Year Anniversary...
2010-06-23
STAr Technologies First Sale of KVD Automatic Test Equipment...
2010-05-25
STAr Announces Exclusive Distributorship of TSC's ATE Manipu...
2010-04-15
Contract Signing Ceremony of Merger Between STAr Technologie...
2010-04-15
STAr Technologies Merged with US-based KVD Company to Establ...
2010-03-12
Semiconductor Test & Measurement Seminar...
2010-02-02
STAr Technologies Announces Expansion of Subsidiary Office i...
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